On the generation of test patterns for multiple faults
نویسندگان
چکیده
منابع مشابه
On the generation of test patterns for multiple faults
This paper presents a new method to generate test patterns for multiple stuck-at faults in combinational circuits. We assume the presence of all multiple faults of all multiplicities and we do not resort to their explicit enumeration: the target fault is a single component of possibly several multiple faults. New line and gate models are introduced to handle multiple fault effect propagation th...
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We propose a new method to identify and test primitive faults in combinational circuits described as multi-level or two-level netlists. A primitive fault is a multiple path delay fault for which none of the single paths contained in the fault is robustly or non-robustly testable while the presence of the fault can degrade the circuit performance. Identiication and testing of primitive faults is...
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ژورنال
عنوان ژورنال: Journal of Electronic Testing
سال: 1993
ISSN: 0923-8174,1573-0727
DOI: 10.1007/bf00971973